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	rdf:_1 <https://pure.iiasa.ac.at/id/person/ext-567696cb2b282f2c9e3480a40db6abdb>;
	rdf:_2 <https://pure.iiasa.ac.at/id/person/ext-1361>;
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	dc:format "text/html";
	dc:title "HTML Summary of #4620 \n\nConfigurations of series-parallel networks with maximum reliability\n\n";
	foaf:primaryTopic <https://pure.iiasa.ac.at/id/eprint/4620> .

<https://pure.iiasa.ac.at/id/eprint/4620>
	bibo:abstract "The optimal design problem for networks with three-state components is the following: select from a given class of networks with n components, each of which can be operative or experience an open-mode or a shorted-mode failure state, the network with maximum reliability. We present an algorithm for solving this problem in the case of two-stage series-parallel networks, i.e. networks consisting of a number of series configurations linked in parallel or vice versa. For practically relevant network sizes (up to 100 components), the algorithm is fast."^^xsd:string;
	bibo:authorList <https://pure.iiasa.ac.at/id/eprint/4620#authors>;
	bibo:issue "2";
	bibo:status <http://purl.org/ontology/bibo/status/peerReviewed>,
		<http://purl.org/ontology/bibo/status/published>;
	bibo:volume "36";
	dct:creator <https://pure.iiasa.ac.at/id/person/ext-1361>,
		<https://pure.iiasa.ac.at/id/person/ext-1475>,
		<https://pure.iiasa.ac.at/id/person/ext-567696cb2b282f2c9e3480a40db6abdb>;
	dct:date "1996-02";
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	dct:publisher <https://pure.iiasa.ac.at/id/org/ext-f308aad1ef8f70546c3a197f104f2ad5>;
	dct:title "Configurations of series-parallel networks with maximum reliability"^^xsd:string;
	owl:sameAs <https://doi.org/10.1016/0026-2714(95)00004-L>;
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	foaf:name "Elsevier"^^xsd:string;
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	foaf:givenName "G.C."^^xsd:string;
	foaf:name "G.C. Pflug"^^xsd:string;
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	foaf:familyName "Ruszczynski"^^xsd:string;
	foaf:givenName "A."^^xsd:string;
	foaf:name "A. Ruszczynski"^^xsd:string;
	rdf:type foaf:Person .

<https://pure.iiasa.ac.at/id/person/ext-567696cb2b282f2c9e3480a40db6abdb>
	foaf:familyName "Gutjahr"^^xsd:string;
	foaf:givenName "W."^^xsd:string;
	foaf:name "W. Gutjahr"^^xsd:string;
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<https://pure.iiasa.ac.at/id/publication/ext-00262714>
	bibo:issn "00262714";
	foaf:name "Microelectronics and Reliability"^^xsd:string;
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