eprintid: 4620 rev_number: 7 eprint_status: archive userid: 351 dir: disk0/00/00/46/20 datestamp: 2016-01-15 02:06:40 lastmod: 2021-08-27 17:15:25 status_changed: 2016-01-15 02:06:40 type: article metadata_visibility: show item_issues_count: 2 creators_name: Gutjahr, W. creators_name: Pflug, G.C. creators_name: Ruszczynski, A. creators_id: 1361 creators_id: 1475 creators_orcid: 0000-0001-8215-3550 title: Configurations of series-parallel networks with maximum reliability ispublished: pub internal_subjects: iis_das internal_subjects: iis_met internal_subjects: iis_mod divisions: prog_ruc abstract: The optimal design problem for networks with three-state components is the following: select from a given class of networks with n components, each of which can be operative or experience an open-mode or a shorted-mode failure state, the network with maximum reliability. We present an algorithm for solving this problem in the case of two-stage series-parallel networks, i.e. networks consisting of a number of series configurations linked in parallel or vice versa. For practically relevant network sizes (up to 100 components), the algorithm is fast. date: 1996-02 date_type: published publisher: Elsevier id_number: 10.1016/0026-2714(95)00004-L iiasapubid: XJ-96-086 creators_browse_id: 229 creators_browse_id: 1544 full_text_status: none publication: Microelectronics and Reliability volume: 36 number: 2 pagerange: 247-253 refereed: TRUE issn: 0026-2714 coversheets_dirty: FALSE fp7_type: info:eu-repo/semantics/article citation: Gutjahr, W., Pflug, G.C. ORCID: https://orcid.org/0000-0001-8215-3550 , & Ruszczynski, A. (1996). Configurations of series-parallel networks with maximum reliability. Microelectronics and Reliability 36 (2) 247-253. 10.1016/0026-2714(95)00004-L .