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    <span class="person">Gutjahr, W.</span>, <span class="person orcid-person"><a href="https://pure.iiasa.ac.at/view/iiasa/229.html">Pflug, G.C.</a> <a target="_blank" href="https://orcid.org/0000-0001-8215-3550" class="orcid"><img src="https://pure.iiasa.ac.at/images/orcid_16x16.png"/><span class="orcid-tooltip">ORCID: https://orcid.org/0000-0001-8215-3550</span></a></span>, &amp; <span class="person"><a href="https://pure.iiasa.ac.at/view/iiasa/1544.html">Ruszczynski, A.</a></span>
  

<span xmlns="http://eprints.org/ep3/control" class="date">(1996).</span>


    <span xmlns="http://eprints.org/ep3/control" class="title"><a href="https://pure.iiasa.ac.at/cgi/users/home?screen=EPrint::View&amp;eprintid=4620"><xhtml:em xmlns:xhtml="http://www.w3.org/1999/xhtml">Configurations of series-parallel networks with maximum reliability.</xhtml:em></a></span>
  


    <span xmlns="http://eprints.org/ep3/control" class="publication"><span style="font-style: italic">Microelectronics and Reliability</span> 36 (2) 247-253. <a target="_blank" href="https://doi.org/10.1016/0026-2714%2895%2900004-L">10.1016/0026-2714(95)00004-L</a>.</span>

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